A framework for reliability-aware embedded system design on multiprocessor platforms

Jia Huang, Simon Barner, Andreas Raabe, Christian Buckl und Alois Knoll

Microprocessors and Microsystems, 38(6):539–551

März 2014 · DOI:10.1016/j.micpro.2014.02.007


This paper presents a model-driven framework that provides a tool-supported design flow for fault-tolerant embedded systems. Its system models comprise abstract descriptions of the application and the underlying execution platform. They provide the input to our analysis and optimization techniques that enable the automated exploration of design alternatives for applications with reliability requirements. The automated generation of source code and platform configuration files speeds up the development process. Our contribution is to advance reliability-aware design further into practice by providing an integrated tool framework and removing unrealistic assumptions in the analyzes. The case studies demonstrate the effectiveness of our approach.

Stichworte:Embedded systems; Reliability; Fault-tolerance ; Design optimization; Model-driven development